A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption

In this paper, we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed method constantly reduces the average and peak power consumption during scan testing. key words: design for testability (DfT), scan testing, scan cell reordering, low power test